Two-wavelength Grating Interferometry for Extended Range MEMS Metrology


TOY M. F., FERHANOĞLU O., ÜREY H.

2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, Hualian, Taiwan, 12 - 16 August 2007, (Full Text) identifier identifier

  • Publication Type: Conference Paper / Full Text
  • Doi Number: 10.1109/omems.2007.4373857
  • City: Hualian
  • Country: Taiwan
  • Keywords: optical sensing, grating interferometry, MEMS metrology
  • Istanbul Medipol University Affiliated: No