IEEE Transactions on Microwave Theory and Techniques, cilt.54, sa.8, ss.3191-3195, 2006 (SCI-Expanded)
This paper presents an improved behavioral modeling technique that generates large-signal models for nonlinear amplifiers or devices based on load-pull AM-AM and AM-PM measurement datasets. The generated behavioral model characterizes the incident and scattering waveforms at two ports in the frequency domain based on the large-signal scattering function theory. The advantage of this technique is that it is derived entirely from load-pull measurements and provides an analytic method to utilize the load-pull measurements in practical designs. Examples are given to demonstrate the ability of the behavioral models to predict the load-related nonlinearities of the device-under-test. © 2006 IEEE.